Thickness measurement and optical characterization of dielectric thin films using surface plasmon resonance

(1), one can easily check that the observed spectral posi- tion of the minima in the reflectivity data and of the maxima of the absolute value of the (negative) Kerr rotation

Of special concern for this work are outbreaks formed by the benthic dinoflagellate Ostreopsis (Schmidt), including several species producers of palytoxin (PLTX)-like compounds,

Frames a to d display (top line) structural evolution of the coalescence and (bottom line) the CNA plots that depict how the structure evolves from ordered fcc NPs (green),

In the previous sections we have shown how astronomical alignments and solar hierophanies – with a common interest in the solstices − were substantiated in the

The newly formed FAPI-PbS QDs are dissolved in FAPI solution for the fabrication of perovskite thin films for the characterization and device applications

The calculations show that the interference pattern of the hole pair is determined by two scattering mechanisms: (i) the electric field excited by the external illumination at the

This splitting of the transmission resonances in rectangular hole arrays does not occur in the EM case, where the incident light excites only surface EM modes travelling along

Focusing on the thin film dielectric constant estimation, we analyze the capability of the EFM (dielectric contrast) 17,18,19 , using both the electrostatic force F and