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The w idths o f the 4 7 0.2 n.m. and 518.8 n.m. lin e s o f AI and the 480,6 n.m. lin e o f A ll hav^ been measured u^ing a Fabry-Perot in te r ­ ferom eter w ith m u lti-la y e r d ie le c t r ic m irrprs, but otherw ise sim ila r to the in terfero m eter used to measure the H and H lin e s . _{a p} The fin e s s e o f th is instrum ent i s about 20 over the raage 470 - 515 n.m. and rath er le s s at 5 1 8,8 n.m. With such a h igh f in e s s e the „

instrum ental broadening o f the fr in g e s i s sm all and was ignored. (The frin g es have a w idth o f about o n e-th ird o f a fre e sp e c tr a l ran ge).

The w idths o f the 470,2 n.m. and 5 1 8.8 n.m . lin e s were 3.32 GHz and 3,16 GHz a t a d isch arge current pf 40 A and a pressu re of 0 .3 torr w ith an u n certain ty o f ± 5%. This i s c o n siste n t w ith the assumption

th a t the broadening i s due on ly to the thermal motion of the atoms. The w idth o f the 470.2 n.m . lin e in c re a se s w ith d isch arge current from 3 GHz to 3.32 GHz as the current is in crea sed from 25 to 40 A

(a t a pressu re o f 0 .3 t o r r ) . The h a lf width o f the 480,6 n,m« lin e i s about 3.5 GHz a t 40 A but the lin e i s too weak to be measured a t 25 Ac

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\ REFERENCES

(1) Jackson, D.A, and P au l, D.M ., J. S c i. I n s t, (J , Phys, E) p p .1077-1080 1969.

(2) K itaeva, V .F ., O dintsov, A.N. and Sobolev, N .N ., Sov, Phys. Usp. 2 2 , pp .699-730 1970,

(3) Sze, R. C. and B en n ett, W.R., Phys, Rev. A p p .837-853 1972, (4) H em q v ist, K.G. and F endley, J .R ., I.E .E .E . J . Quant. E le c t. 3^

p p .66-72 1967.

(5) C ornish, J.C .L , and M aitland, A ., J , Phys. E S c i. I n s t. 6^,

p p .880-884 19 73.

(6) M aitland, A. and Dunn, M.H., Laser P hysics (N orthrH olland, 19 6 9 ). (7) P r e s c o tt, L .J . and Van der Z ie l, A ., J . Quant. E le c t. p p .173-

177 1966.

(8) Freed, C. and Hauss, A .H ., Appl. Phys. L e tts , p p .85-87 1965. (9) Garscadden, A ., B le tz in g e r , P. and F ria r, E .H ., J . Appl. Phys.

p p .3432-3433 1964.

(10) Zakharenko, Yu G. and P r iv a lo v , V .E ., Opt. and S p ectro sc, 2 9 , p p .124-127 1970,

(11) G alehouse, B .C ., Ingard, U-, Ryan, T .J . and E}«ekiel, S ., Appl. Phys. L e tts . 18, p p .13-15 1971.

(12) Suzuki, T ., Jap. J . Appl. Phys. 10, p p .1419-1424 1971. (13) Pupp, W., Physik Z. 34, p p .756-761 1933.

(14) Yosim oto, H ., J , Phys. Soc. Jap. _8, p p .59-68 1953. (15) Ogwa, K ., J . Phys. Soc. Jap. 1 4 , p p .1746-1751 1959.

(16) R oss, J .N ., J . Phys. D : Appl. P hys. p p .1917-1928 1973. (17) C o u lter, J.R .M ., Armstrong, N.H.K. and Erne le u s , K.G., Proc.

Phys. Soc. 77, p p .476-482 1961.

(18) Jackson, A .T ., J. Phys. D : Appl. Phys. p p .1963-1964 1971. (19) Pupp, W., Physik Z. 22» p p .844-847 19 32.

(20) O leson, N.L. and Cooper, A.W ., Advances in E le c tr o n ic s and 1968.

- 83'

(21

(22 \

Grossü, D. , Rev, Rouni. Phys. 16, p p .1035-1037 1971,

M aitland, A ., B r it. J, Appl, Phys. (J . Phys. D) 2y p p .535-539 1969,

(23) Targ, R. and Yarborough, J.M ,, Appl. Phys, L e tts . 1 2 , p p .3-4 1968.

(24) Sm ith, P.W ., Proc. I.E .E .E . 5^, p p .1342-1357 1970,

(25) Hodara, H, and George, N ., I.E .E .E . J . Quant. E le ç t, p p .337- 340 1966.

(26) Uchida, T. and U eki, A ., I.E .E .E . J . Quant, E le c t, 3^, p p .17-30 1967,

(27) B rid g es,■ T .J . and R igrod, W.W., I.R .E .E . J , Quant, E le c t. ]^, p p .303-308 1965.

(28) H a rris, S.E . and Targ, R ., Appl. Phys. L e tts . p p .202-204 1964, (29) H a rris, S.E, and McDuff, O .P ., I.E .E .E , J , Quant. E le c t, 1_,

p p .245-262 1965.

(30) Lamb, W.E. J r ., Phys. Rev. A 134, p p .1429-1450 i9 6 4 ,

(31) R oss, J .N ., J. Phys. D : Appl. Phys. 4 , p p .1092-1099 1971. (32) M aitland, A, and C ornish, J .C .L ., J. Phys. D : Appl. Phys.

p p .1807-1814 1972.

(33) Vpn E ngel. A . , P h il. Mag. p p .417-426 1941.

Il II II

(34) G unterschulze, A ., Bar, W. and B eta, H ., Z, fu r Phys. 1 0 9 , p p .293-309 1938.

(3 5 ), Griem, H .R ,, Plasma Spectroscopy (McGraw-Hill Book Company, New York, San F ra n cisco , Toronto, London 1 9 6 4 ).

(36) Rapp, D. and Englander-G olden, P ., J . Chem. Phys. 4 3 , p p .1464- 1479 1965. .

(37) V rien s, L ., Phys. L e tts , _8, p p .260-261 1964.

(38) H erziger, G. and S e e lig , W,, Z. Phys. 215, p p .437-465 1968. (39) De Mars, G ., S eid en , M. and H orrigan, F .A ., J . Quant, E le c t,

4 , p p .631-637 1968.

(40) S w ift, J.D . and Schwar, M .J.R ., 'E le c tr ic Probes fo r Plasma D ia g n o stic s' ( I l l i f e Books Ltd. 1970).

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(41) Chen, P .P ., 'E le c t r ic Probes' in 'Plasma D ia g n o stic Techniques' Ed. H uddlestone, R.H. and Leonard, S.L . (Academic P r e ss, New York, London, 1965).

(42) Crawford, F.W ., J . Appl. Phys. 34, p p .1897-1902 1963.

(43) Bos c h i, A. and M a g is tr e lli, P ., II Nuovo Cimento 2 9 , p p .488- 499 1963.

(44) Von E ngel, A ., 'Io n iz e d Gases' (second e d itio n ) p .51 (Oxford U n iv ersity P r e ss, 1965).

(45) El-K areh, A.B. and El-K areh, J .C .J ., E lectron Beams, Lenses and O p tics, Vol. 1 (New York: Academic P ress 1 9 7 0 ),