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PROBLEMÁTICA AMBIENTAL MUNICIPAL.

DIAGNÓSTICO

NOMBRE COMÚN NOMBRE COMÚN

1.5 PROBLEMÁTICA AMBIENTAL MUNICIPAL.

In IAL, each feature’s discrimination ability can be estimated in this feature's one-dimensional

space. Features can be ordered by the ranking value of the feature discrimination ability. For

two-class classification problems (c2), based on Eq.(6.1), the discrimination ability of feature fi can

be given by

(6.3)

where μ1 and μ2 are the means of two classes, and s1 and s2 are within-class variances.

However, Eq.(6.3) is too simple to cope with multi-category classifications, because the

between-class scatter is difficult to describe merely by distance between patterns. Here, the

difference between the centres of these multiple classes should be replaced by standard

deviations of centres and standard deviations of patterns, so that the influence brought by classes

whose mean is not the smallest or the largest of all the means of classes can be measured.

Definition 6.1: Single Discriminability (SD) is a ratio between a feature by the standard deviation of all class centres and the sum of standard deviations of all patterns in each

class.

SD for both two-category and n-category classification problems can be integrated as

(6.4)

where n is the total number of classes, and std denotes the standard deviations, one for all patterns

belonging to cj in feature i, and the other for the vector consisting of the means of all classes in

feature i. Let x be the vector for standard deviation calculation, the standard deviation of x is:

(6.5)

where the vector , xk is the value of k th

pattern, and r is the total number of patterns.

Obviously, in Eq.(6.5), the part of is a distance between kth pattern and its mean. Thus, let dist replace this part, then Eq.(6.5) can be re-written as:

FEATURE ORDERING BASED ON LINEAR DISCRIMINANT

(6.6)

where denotes the distance of kth pattern in x and its mean .

Obviously, according to Eq.(6.6), the essence of SD indicates two kinds of distance, one is

the distance between classes, and the other is the distance within each class. These are similar to

FLD, where the further the distance between different classes and the nearer the distance between

each pattern and its class centre, the easier these classes can be distinguished. Here, easier means

the probability of correct prediction in pattern recognition is higher. For example, Figure 6.1

shows a normalized dataset which has two classes. The class centres are a and b, and x is one of

its features. According to a and b, the feature space of x can be divided into three parts: [0, a], (a,

b], and (b, 1]. Taking a random number produced by a classifier as a segmentation point, the

probability of a random number in [0, a] is P1=a/1=a; that in (a, b] is P2=(ba)/1=ba; and that in (b, 1] is P3=(1-b)/1=1-b. If we want to make the classification easier, we must enhance P2 and reduce P1 and P3. Therefore, for P1, a should be reduced; for P2, b should be increased and a

should be reduced; and for P3, b should be increased. As a result of reducing a and increasing b, the

distance between a and b will be larger.

x

Segmentation Point Segmentation Point

x

Segmentation Point

x

0 a b 1

0 a b 1

0 a b 1

Figure 6.1: Segmentations on x.

This is similar to FLD, where the greater the standard deviation of a and b, the easier the

classification. In the example shown in Figure 6.1, if is the mean of a and b, the standard deviation of a and b is

Substituting for and simplifying: Since , we get (6.8)

Therefore, according to Eq.(6.8), if the distance between a and b is greater, the standard

deviation of a and b will also be greater. Namely, greater distance indicates easier classification,

and greater standard deviation will also imply easier classification.

If there are three or more classes in one feature space, Eq.(6.5) also works very well.

Assuming that there are two pattern sets, one is a= , and the other is

b= , , then relations of the mean and standard deviation are:

(6.9)

. (6.10)

According to Eq.(6.9) and Eq.(6.10), when n=3, if the two pattern sets are , and

, then (6.11) . (6.12)

FEATURE ORDERING BASED ON LINEAR DISCRIMINANT

Obviously, if and both increase, then will increase correspondingly. The key elements here are the distance between a1 and a2, and the

distance between the centres of , and a3. The further the distance, the lower the classification error rate is.

Similarly, when n=4, if the two pattern sets are , and , then

(6.13) (6.14)

Similar to the situation of n=3, the further the distance between a1, a2, a3, and a4, the better

the pattern recognition performance.

We assume that there is an n-category classification problem, then it needs n-1 segmentation

points. When n=k,

(6.15) Eq.(6.15) shows that the standard deviation depends on the distances between patterns. Then

when n=k+1, the two pattern sets are , and .

(6.16)

(6.17)

Therefore, when n=k+1, the also depends on the distance between patterns. More specifically, is decided by and the distance between centres of , and . However, and depend on the value of and Eventually, they depend on the distance between every two samples.

Therefore, based on these properties of standard deviation and mean, the calculation of SD

which is presented in Eq. (6.4) is obviously applicable in IAL feature discrimination ability

computing. During the process, standard deviations between multiple classes and within classes

can be calculated. Generally, the greater the "between" standard deviation means the greater the

total distance, then the lower the probability of errors are. Absolutely, in the mean while, the

"within" standard deviation which is influenced by the pattern distribution of each class, can

reflect the tightness of each class centre.

Generally speaking, to effectively distinguish patterns from each other, it is necessary to

ensure that the total distance between pattern centres should be the greatest. Therefore, SD,

which is inspired from FLD can deduce feature discrimination ability well. Thus, SD is suitable

to address the problems in multi-category classification. However, similar to FS, SD also

computes features one by one, therefore, it also cannot handle feature redundancy during the

feature ordering calculations.