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3.3 Current Current Mirrors Mirrors

3.3.1

3.3.1 Basic Basic Mirror Mirror Operation

Operation

The objective of a current mirror is to duplicate its input current at its output, irrespective of the output voltage present. To do this without errors, two transistors must match and all their respective port-to-port voltages must equal. However, since collector-emitter and drain-source voltages vCE and vDS have minimal impact on collector and drain currents iCand iD in the transistors’ high-gain mode (i.e., for-ward active or slightly saturated for BJTs and saturation for FETs), vCE and vDSneed not equal for their currents to match reasonably well, as long as vBE’s and vGS’s equal. For example, short-circuiting the base-emitter and gate-source control terminals of matched transistors, as shown in Fig. 3.1a and b, and ensuring their respective collector-emitter and drain-source voltages are sufficiently high, produce an output current that is approximately equal to its input:

i I v Connecting the input transistor ’s collector (or drain) to the base (or gate) ensures the input current charges the parasitic base-emitter (or gate-source) capacitance until the collector (or drain) current is equal to input current iIN, at which point the capacitor stops charging

io1

FIGUREIGURE3.183.18 Common-mode equivalent half circuit.

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Chapter ThreeChapter Three

and vBE(or vGS) is set. Because connecting the collector and base termi-nals amounts to using the BJT as a base-emitter pn-junction diode, QINand MINin Fig. 3.19a and b are said to be diode connected.

This mirror configuration is also useful for amplifying or attenuat-ing a current by a constant factor because changattenuat-ing the number of transistors in the input and/or output of the circuit modifies the cir-cuit’s input-output gain ratio. For instance, using three matched paral-lel transistors in the input equally splits input currentiINinto three and using two matched parallel transistors at the output ensures the frac-tional current flowing through each input device (i.e.,iC= iIN/3) flows through each output device, yielding a sum total of 2iCor 2iIN/3, as depicted in Fig. 3.20a. This mirror configuration mimics the effects of having an input transistor with 3 times the minimum emitter area and an output device with 2 times the minimum emitter area. The same idea applies to MOSFETs, except gain is set by width-length aspect ratios (i.e., W /L), as illustrated in the 2× mirror shown in Fig. 3.20b.

Performance Performance

Important metrics of a current mirror include its accuracy, input and output voltage limits, input and output resistances, gain, and band-width. To start, with respect to accuracy, base currents in BJTs subtract a fraction of the input current flowing into the mirror. In the case of a one-to-one npn mirror, for example, bases pull and subtract two base

(a) (b)

iOUT iIN

M O M IN

V DS>V DS(sat) iOUT

iIN 2i B

QO QIN

V CE>V CE(min)

F

FIGUREIGURE3.193.19 Basic (a a ) npn and (b b ) n-type MOS current mirrors.

(a) (b)

iOUT= 2iIN /3 iIN

i C i = I N / 3

i C i = I N / 3

A = 2x A = 3x

iOUT= 2iIN iIN

2W / L W / L

F

FIGUREIGURE3.203.20 Nonunity (a a ) BJT and (b b ) MOSFET current mirrors.

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currents (i.e., 2iB) from input current iINand consequently cause the output (which is a collector) to sink a lower current (i.e.,iOUT< iIN),

i i i i IN

≈ + ≈

C B

+

Ci

OUT

⎝ ⎜ ⎞

⎠ ⎟ = ⎛ +

⎝ ⎜ ⎞

⎠ ⎟

2 1 2

1 2

β β

(3.67)

where iBis the base current into QINand QO in Fig. 3.19 a. Slightly increasing the base-emitter voltage of output transistor QOwith an ohmic voltage drop increases its collector current, partially compen-sating for the mirror’s

β

error, as illustrated in Fig. 3.21 a. Since the collector’s current variation

Δ

iOUTis the result of a small change in its base-emitter voltage

Δ

vBE, equating resistor voltage vRto the lin-ear first-order transconductance (i.e., gm) translation of the error current (i.e., NiB, where N is the effective number of bases attached carrying equivalent input currents) compensates the mirror error to first order:

Δ

i OUT

= ≡

Ni B v g

Δ = =

BE m v g R m i R g(B β) m (3.68)

or

R N

g

NV

m I

β

≡ ≈

t IN

(3.69)

where I INis the dc value of input current iIN.

Alternatively, while placing a series

β

-helper BJT level shifter in the collector-base connection path, as shown in Fig. 3.2b, decreases the error current by a factor of

β

, a series MOSFET (Fig. 3.21c) alto-gether eliminates it, given the latter carries no gate current. The pur-pose of the load resistor attached to the

β

-helper transistor, by the way, is to establish a bias current that pushes the pole associated with

(b) (c)

(a)

iOUT

iOUT iOUT

iIN

iIN iIN

2i B 2i B

i B Rβ +

β

F

FIGUREIGURE3.213.21 Basic npn current mirrors with (a a )β-compensating resistor, (b b ) npnβ-helper, and (c c ) MOSβ-helper.

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Chapter ThreeChapter Three

that node to high frequencies. In any case, the simplicity of the

β

-compensating resistor often offsets its relatively poorer accuracy, given its resistance cannot easily track or adjust to a changing input current iIN.

As already mentioned, all port-to-port terminals in the mirror cir-cuit must equal (i.e., all base- and collector-emitter and gate-, drain-, and bulk-source voltages equal) to produce a quasi-perfect replica of the input current at the output. The collector-emitter and drain-source voltages in the basic current mirror, however, do not match, and although their effects are minimal, they still induce a gain error that is the result of base-width and channel-length modulation effects:

A i

where AI refers to the mirror gain of each equally sized transistor seg-ment in the current mirror, which would otherwise be 1. For instance, the vCE-induced systematic gain error of a basic mirror with its output at 3 V and an Early voltage V Aof 50 V, assuming a base-emitter volt-age of 0.7 V, is approximately 4.3%, excluding random mismatch errors between supposedly matched transistors.

The input and output voltage limits for which the mirror main-tains its prescribed gain is also important. Ideally, the input and out-put voltages should reach both positive and negative supplies without significant impact on the output current. However, the input voltage in a basic current mirror is one base-emitter voltageV BEor gate-source voltage V GSfrom ground, which can be on the order of 0.55–1.5 V, depending on process, size, temperature, and current density.

β

-helper transistors unfortunately increase the overhead by anotherV BEor V GS, unlike

β

-compensating resistors, which are relatively benign to the circuit in this respect, albeit with poorer accurate. The voltage over-head associated with the output is the lowest voltage the output transistor can tolerate across its collector-emitter or drain-source terminals without significantly altering its output current, which cor-responds to deep saturation limitV CE(min)or saturation voltage V DS(sat) (e.g., 0.2–0.5 V).

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Small-Signal Response at Low Frequency Small-Signal Response at Low Frequency

When considering the small-signal gain of the circuit, accounting for the effects of the source and load is important. Before including these effects, however, it is best to simplify the circuit where possible. To this end, Fig. 3.22a illustrates the complete small-signal equivalent circuit of the basic npn current mirror shown in Fig. 3.19 a and Fig. 3.22b shows its simplified but loaded counterpart. In diode-connecting input transistor QIN, for instance, the equivalent resistance into QIN’s transconductor gm.IN becomes 1/ gm. M because the current flowing through the diode-connected device is linearly proportional to its own terminal voltages. As such, the input resistance of the circuit (i.e., RIN) reduces to 1/ gm.IN, the lowest resistance in the parallel combination that RIN comprises, which also includes base-emitter resistors rπ.INand rπ.Oand QIN’s output resistance ro.IN:

R r r r

g g

O o

m m

IN IN IN

.IN .IN

=

π . ||π. || . || 1

1

(3.72)

Base-collector capacitor Cμ also disappears in the simplified circuit because its two terminals are short-circuited, which means Cμ’s dis-placement (i.e., ac) current is zero (i.e., Cμproduces no effects in the

2 C π C µ

v i n g m

vin vout

r o RS

is

i L o

d a

R L

o a d LC

o a d

Z IN Z OUT

r π C π C µ

iout

r o

QIN iin

v b e g m

r π C π

C µ r o

QO v b e

g m

(a)

(b)

F

FIGUREIGURE3.223.22 (a a ) Complete and (b b ) simplified (but loaded) small-signal model of a basic npn current mirror.

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Chapter ThreeChapter Three

circuit). The output of the circuit remains intact and output resistance ROUTreduces to QO’s ro, the only resistance present.

Perhaps the more meaningful definition of the small-signal gain of the mirror is the translation of source currentisto load current iLoadin the presence of source resistanceRSand load capacitanceCLoadbecause both RSand CLoadrepresent realistic operating conditions. As discussed

earlier in this chapter, decomposing the signal path into its equivalent current-voltage and voltage-current translations and using the results obtained in the single-transistor section helps ascertain the gain across the circuit. In this case, small-signal low-frequency current gain AI .LFis the product of small-signal translationsis to input voltage vin, vin to transconductor currentigm, igmto output voltagevout, and voutto iLoador

A i

assuming a one-to-one area ratio between the matching transistors (i.e., gm.INequals gm.O). Note that a gain of 1 only results when RINis considerably smaller than RS and ROUT larger than RLoad; in other words, ideal input and output resistances RINand ROUT, respectively, approach zero and infinitely high values.

Small-Signal Response at High Frequency Small-Signal Response at High Frequency

The operation described thus far assumes steady-state conditions and therefore relates to low frequency only. To ascertain the high-frequency response of the circuit, it is usually easier to start at low frequencies and find the poles that exist as frequency increases, short-circuiting the capacitor that produced poles at lower frequencies.

Before analyzing the circuit, though, as noted earlier, QIN’s Cμ.IN is short-circuited (Fig. 3.22a) so no ac voltage exists across its terminals and consequently no ac current results through the device, which means, for all practical purposes, Cμ.INdoes not exist.

Noting RINis generally low and ROUTis high reveals output pole pO precedes input pole pINas frequency increases. As a result, with respect to dominant pole pO, loading capacitor CLoadand Cμsteer cur-rent away from the output when their collective impedance is equal to or smaller than their equivalent parallel resistance (i.e., ro||RLoad).

Because the base terminal side of Cμis at a low-resistance point (i.e., 1/ gm from ground), its associated series impedance has negligible

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effects on the total capacitor impedance so pOoccurs when both CLoad and Cμ shunt ro||RLoad:

As frequency increases past pO, assuming CLoadis dominant, CLoad becomes a short circuit and QIN’s Cπ.INand Cμ.INand QO’s Cπ.Obegin to shunt and steer current away from QIN’s base, decreasing input volt-age vinand the output current it produces in transistor QO(i.e., iout).

The Miller effect of Cμ.INis low because pO, at this point, decreased much of QO’s CE gain, which also means voutis a low-impedance node (to ac ground). As a result, the effects of input (mirror) pole pINoccur when equivalent input capacitance CIN(or Cπ.IN, Cμ.O, and Cπ.O) shunt the parallel combination of RINand RS:

1 1

Capacitor Cμor CGD, as in the CE/CS transistor case, also consti-tute an out-of-phase feed-forward path whose effects prevail at and above frequencies where the capacitor current is equal to or greater than the mirroring transconductor current. Input pole pINprecedes this right-half-plane zero (i.e., zRHP), which resides at gm/2πCμ or gm/2πCGD, because the parasitic capacitance associated with the for-mer exceeds the latter. It is important to keep zRHPwell above frequen-cies of interest because its right-half-plane effect not only extends bandwidth to problematic frequency regions, where several parasitic

poles reside, but also decreases phase in the process.

3.3.2

3.3.2 Cascoded Cascoded Mirror Mirror Operation

Operation

The objective of the cascoded mirror with respect to its basic counter-part is twofold: (1) improve mirroring accuracy and (2) decrease sen-sitivity to variations in output voltage (i.e., increase output resistance).

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Chapter ThreeChapter Three

The idea is to eliminate base-width and channel-length modulation effects in the mirroring devices by forcibly equating their respective collector-emitter or drain-source voltages with cascode transistors.

Because cascode devices (e.g.,QCINand QCOor MCINand MCOin Fig. 3.23a and b) carry the same current density, their base-emitter or gate-source voltages and therefore their emitter or source voltages equal (e.g.,QIN’s and QO’s collector-emitter voltagesvCE’s equal), eliminating all modu-lation effects. Sincev

CE’s orv

DS’s are equal tov

BEorv

GSwith respect to ground, variations in the output voltage have minimal impact on the port-to-port voltages of the mirroring devices (e.g.,QINand QOor MIN and MO), producing little effects in output currentiOUT, that is to say, increasing the output resistance of the mirror.

Performance Performance

As in the basic mirror, base currents degrade the accuracy perfor-mance of cascoded mirrors and

β

-compensation resistors and

β

-helper transistors help reduce those effects. Unlike the basic mirror, however, base-width and channel-length modulation effects on the mirroring

devices are less prevalent, although random, process-induced mis-match errors remain. Unfortunately, eliminating the modulation errors increases the input and output voltage requirements of the circuit. For instance, in the case of the cascoded mirrors in Fig. 3.23a and b, the dc input voltage is the voltage across two diode-connected devices (i.e., 2V BEor 2V GS) and its output must exceed the diode-connected voltage impressed across the output mirroring device by one collector-emitter or drain-source voltage (i.e.,V BE+ V CE(min)or V GS+ V DS(sat)).

Relaxing the input and output headroom requirements of the cascode circuit amounts to eliminating the dc voltage effects of the cascode transistors. For instance, disconnecting the bases or gates of the cascodes from the circuit and appropriately biasing them one base-emitter or gate-source voltage above one saturation voltage, as in Fig. 3.24a and b, continues to equate the vCE’s or vDS’s across the

(a)

iOUT iOUT

iIN iIN

(b) V OUT>V BE+V CE(min) V OUT >V GS+V DS(sat)

QO

QIN M IN M O

QCO

QCIN M CIN M CO

V CE.IN=V CE.O V DS.IN=V DS.O F

FIGUREIGURE3.233.23 (a a ) NPN- and (b b ) NMOS-cascode current mirrors.

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mirroring devices (although now at V CE(min)or V DS(sat)) while avoiding their V BEor V GSimpact on headroom. The input voltage is therefore back to what it was in the basic current mirror, at one V BEor V GS above ground, but its output must now exceed two minimum satu-ration voltages, which is higher than in the basic mirror but lower than in the simple cascode version shown earlier. Note that generat-ing the bias voltage requires additional circuit, silicon real estate, and power. In the sample BJT embodiment shown in Fig. 3.24a, for example, the resistor shifts up a base-emitter voltage by only the minimum collector-emitter voltage a BJT can sustain before entering the deep saturation region. Similarly, the aspect ratio (i.e., W /L) of biasing transistor MX(and/or its biasing current) in the MOS exam-ple shown in Fig. 3.24b is sufficiently low to ensure its saturation voltage is large enough to accommodate the saturation voltage in the gate-source voltage of the cascode device (e.g., V DS2(sat)) and ensure the voltage across the mirroring transistor is above its saturation point (e.g., V DS1(sat)):

V V V GSX

= +

T DSX satV V

≡ +

( ) GS2

= +

V V DS sat1( ) T DS sa2( tt)

+

V DS sat1( ) (3.76) or

V DSX sat( )

V DS sat1( )

+

V DS( sat2 ) (3.77) Small-Signal Response at Low Frequency

Small-Signal Response at Low Frequency

Figure 3.25 presents the complete and simplified but loaded small-signal equivalent circuits of the cascoded mirror circuit, which amount to two diode-connected devices on the input and a CE cascode

(a) (b)

V OUT> 2V DS(sat) V OUT> 2V CE(min)

V GS2+V DS1(sat)

V BE+V CE(min) V C

E ( m i n )

(W / L)X< (W / L)l

M 1 M 2 M X

V GSX – +

– +– + V BE

F

FIGUREIGURE3.243.24 (a a ) NPN and (b b ) NMOS low-voltage cascode current mirrors.

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Chapter ThreeChapter Three

transistor degenerated with a CE transistor on the output. Transistors QINand QOconstitute a basic mirror and they therefore simplify to the small-signal equivalent circuit shown in Fig. 3.22 b and again in Fig. 3.25b. Similar to the mirror, the current flowing through QCIN’s base-emitter resistance rπ.CINand output resistance ro.CINare negligibly smaller than their transconductor counterpart, whose equivalent resistance is 1/ gm, so their effects, for all practical purposes, disap-pear in the simplified small-signal circuit. QCIN’s base-collector capac-itor Cμalso disappears because there is no voltage across it to induce a current. As always, rπ’s disappear and vgs, CGS, CGD, and rdsreplace v be, Cπ, Cμ, and ro, respectively, in the MOS case.

The input resistance (i.e.,RIN) of the circuit is the parallel combina-tion of the resistance into the two diode-connected devices and the resistance into the base of output cascode transistorQCO. The resis-tance QCOpresents, however, is considerably higher than the two 1/ gm

C π C π

C µ C µ

r π

r π v b e

g m

v b e g m

r o r o

iOUT iIN

QCIN QCO

(a)

(b)

QIN QO

Q C

I N CQ

O

M i r r o r

i L o

d a

vin vout

r o RS

is

R L

o a d C L

o a d

Z IN Z IN. CO Z OUT

C π C µ

r π b ev g m

r o

r π C π C µ

v b e g m

r o

2C π C µ

C µ C π C π

r π

v b e g m

v b e g m

1 / g m 1 / g m

r o

F

FIGUREIGURE3.253.25 (a a ) Complete and (b b ) simplified (but loaded) small-signal equivalent circuits of the cascode current mirror.

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resistances associated with the diode-connected devices because of the degenerating effects mirroring output resistancero.Mhas on QCO. As a result, QCOintroduces a

β

-translation ofro.Mto the input, reducing RINto roughly 2/ gm:

where rπdisappears and

β

approaches infinity in the MOS case.

The degenerating effects of ro.Mon QCOalso manifest themselves in the output resistance of the circuit (i.e., ROUT), except ro.Mis not the only degenerating factor. In fact, QCO’s base-emitter resistance rπ.CO, the diode-connected devices (2/ gm), and the mirror’s output trans-conductor gm.Mpresent another resistance at QCO’s emitter. Because the bottom devices constitute a current mirror, output mirror transis-tor QOsinks a mirrored version of the base current flowing through output cascode device QCO(i.e., igm.O

irπ.CO), which means the total emitter-degenerating current is twice QCO’s base current and ro.M’s smaller current contribution, which means the equivalent emitter degenerating resistance is approximately rπ/2:

R v

where RDEG.COis QCO’s effective degenerating resistance, iπ.COis QCO’s base current, igm.Ois QO’s transconductor current, and io.Ois the cur-rent flowing through ro. M(which is considerably smaller than iπ.CO).

Note that in the MOS case rπdisappears and iπ.COis zero so degener-ating resistance RDEG.COreduces to rds.O. In any case, the degenerated output resistance of the circuit is relatively large at approximately RDEG.COro.COgm.CO,

R OUTr R

= +

o .CO

+

DEG.COR r g DEG.CO

R o .CO m.CO DEG.COOr o .COgm.CO (3.80) where RDEG.COand ROUTare 0.5rπand 0.5

β

rofor BJTs and rdsand rds2 gm for MOSFETs. Note ROUTwould be infinitely large if base-width and channel-length modulation effects (i.e., differences invCEand vDS) were

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Chapter ThreeChapter Three

nonexistent, yetROUTfor the cascode circuit, whose purpose is to elim-inate these effects, is finite. The reason for this finite value is that changes in vOUTinduce small variations in thevCEor vDSof the bottom output mirror device via the modulation effects of the cascode, thereby introducing vCEor vDSdifferences between the mirroring transistors.

Because cascode devices QCIN and QCO simply channel current into and out of a basic mirror, the low-frequency small-signal current gain of the circuit (i.e., A

I .LF) is roughly the same as that of the basic mirror, except with mitigated (but not completely eliminated) base-width and channel-length modulation effects. To fully comprehend all loading effects, however, source and loading resistances are included in the analysis and the current gain is defined as the transla-tion of source current isto load current iLoad. As such, low-frequency current gain AI.LFis the product of its constituent small-signal transla-tions: isto vin, vinto mirror’s base voltage vb.M, vb.Mto mirror’s output transconductor current igm.M, igm.Mto QCO’s emitter voltage ve.CO, ve.COto QCO’s transconductor current igm.CO, igm.COto vout, and voutto iLoador As with any mirror, input and output resistances RINand ROUTshould

I .LF) is roughly the same as that of the basic mirror, except with mitigated (but not completely eliminated) base-width and channel-length modulation effects. To fully comprehend all loading effects, however, source and loading resistances are included in the analysis and the current gain is defined as the transla-tion of source current isto load current iLoad. As such, low-frequency current gain AI.LFis the product of its constituent small-signal transla-tions: isto vin, vinto mirror’s base voltage vb.M, vb.Mto mirror’s output transconductor current igm.M, igm.Mto QCO’s emitter voltage ve.CO, ve.COto QCO’s transconductor current igm.CO, igm.COto vout, and voutto iLoador As with any mirror, input and output resistances RINand ROUTshould

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