• No se han encontrado resultados

Etapas para la formulación de un proyecto empresarial

Etapa V. Definición de las acciones correctivas

5.3. Etapas para la formulación de un proyecto empresarial

This section presents the stability analysis for the N-Input current (reset) programming loop described in section 6.2.3.1, the schematic is shown in figure A.6. For a closed loop system, it is essential to make sure that the circuit is stable in the desired operating point. Furthermore it must be made sure that this operating point can be reached safely when powering the circuit. Simulation shows, that a DC operating point can be found for any bias current supplied by Rbias. For the operating point to be stable, negative DC feedback must be applied in the loop and the loop gain must have dropped to below unity before the phase of the loop has decreased by an additional 180◦. This is intuitive because negative feedback plus a negative phase shift of 180◦ degrees essentially generates positive feedback at the input if the gain is larger than unity. Positive feedback creates a pile-up effect at the input causing oscillations. The so-called phase margin is defined as the difference of phase at the unity gain crossover frequency and 180◦. The system is stable if the phase margin is positive, but it is susceptible to ringing, the closer the phase margin gets to zero. For a large phase margin the system settles very slowly. A phase margin of 60◦ is generally considered the optimum value [28], delivering negligible peaking while providing fast settling.

The filter input node contributes the most dominant pole of the system which is given by:

ω0= 1

Rout,ICON(1 + A)Cf

(A.310) where A is the open loop gain of the filter amplifier, R is the total resistance at the negative input of the amplifier and Cf is the integrator (filter) feedback capacitance. R is given by the output resistance of the ICON cell. The secondary pole is given by:

ω1=

1

ron,SwResCin+ cgd ,NgmNrds,N

TCascP ICON Integrator (FCF) VRes Storage SOURCE VSSS VSSA TGain TStab VDDA Pre- amplifier Cstray Cres Vref Bias Voltages SwProg SwProg SwProg SwRes QIn Vstore Vres TCascN ires ibias RICON

Figure A.6: Detailed view of the current programming loop. All SProg and the SRes switches are closed to establish the loop while SRes is pulsed to clear a collected signal from the input node.

where Cin is the total shunt capacitance at the input node ground and the and small signal parameters subscripted by N belong to the input NMOS transistor (TGain). Note that node vx (see figure A.5) is not a virtual ground node in the programming phase. The lowest resistance at vx (even without RICON is given by the channel resistance of TGain (rds,N). This situation configures the input branch as a voltage gain stage with a gain of AN = gmNrds,N. The gate-drain capacitance of TGain is therefore amplified by AN (Miller effect) making it non-negligible. To improve the stability, the most effective measure is to split the poles further apart in frequency. This can be achieved by

(1) Reducing ω0 with respect to ω1. This measure starts to dampen the gain at an earlier frequency, such that the gain crossover decreases in frequency increasing the phase margin.

(2) Increasing ω1 with respect to ω0. This measure is only effective if ω1 is pushed out far enough that its phase shift occurs when the loop gain is already sufficiently low.

Due to the enourmous DC loop gain of ≈ 109 dB the most effective means to generate additional pahse margin is to increase Cf and / or Rout,ICON. In Figure A.8, the phase margin is plotted against the Cf for different process corners. The maximum possible capacitance (due to area constraints) is 13 pF, for the (very extreme) fast-fast-functional corner (’fff’) a further increase of Rout,ICON is necessary to reach a phase margin of 60◦.

−80 −60 −40 −20 0 20 40 60 80 10m 1 100 10k 1M 100M Lo op Gain (dB) Frequency (Hz) Cf=1 pF Cf=10 pF −400 −300 −200 −100 0 10m 1 100 10k 1M 100M Lo op Phase ( ◦) Frequency (Hz) Cf=1 pF Cf=10 pF

Figure A.7: Loop gain and phase of the closed programming loop. The phase margin can be incrased by increasing the amplifier feedback capacitance.

0 10 20 30 40 50 60 70 80 0 2 4 6 8 10 12 14 Phase Ma rgin ( ◦) Filter Cf (pF)

NInput IProg Stability vs. Corners

fff, icon 1/3 fff, icon 1/6 tt

Bibliography

[1] Karsten Hansen. Private communication. DESY FEC, Hamburg. [2] The European XFEL, Hamburg, Germany. http://www.xfel.eu/.

[3] The European X-Ray Free-Electron Laser technical design report. http://xfel.desy.de/ technical_information/tdr/tdr/, 2007.

[4] C. Pellegrini. The history of X-ray free electron lasers. The European Physical Journal H, 37(5):659–708, Oct. 2012.

[5] Peter Schmüser, Martin Dohlus, and Jörg Rossbach. Ultraviolet and Soft X-Ray Free-Electron Lasers: Introduction to Physical Principles, Experimental Results, Technological Challenges. Springer Publishing Company, Incorporated, 1st edition, 2008.

[6] Linac Coherent Light Source. https://lcls.slac.stanford.edu/.

[7] Spring-8 Angstrom Compact Free Electron Laser. http://xfel.riken.jp/eng/index.html. [8] C Pellegrlni. A 4 to 0.1 nm FEL Based on the SLAC Linac. In Proceedings Workshop on Fourth

Generation Light Sources, page 364, 1992.

[9] Free-electron laser FLASH, Hamburg, Germany. https://flash.desy.de/.

[10] Free-electron laser FLASH: How does it work? http://photon-science.desy.de/ facilities/flash/the_free_electron_laser/how_it_works/high_gain_fel/index_ eng.html.

[11] A. M. Kondratenko and E. L. Saldin. Generation of coherent radiation by a relativistic electron beam in an ondulator. Particle Accelerators, 10:207–216, 1980.

[12] Heinz Graafsma. Requirements for and development of 2 dimensional X-ray detectors for the European X-ray Free Electron Laser in Hamburg. Journal of Instrumentation, 4(12):P12011, 2009.

[13] A. Klyuev et al. AGIPD, a high dynamic range fast detector for the European XFEL. Journal of Instrumentation, 10(01):C01023, 2015.

[15] B. Heisen et al. Karabo: An Integrated Software Framework Combining Control, Data Manage- ment, and Scientific Computing Tasks. In 14th International Conference on Accelerator & Large Experimental Physics Control Systems, ICALEPCS 2013, Oct 2013.

[16] J Coughlan, C Day, S Galagedera, and R Halsall. The Train Builder data acquisition system for the European-XFEL. Journal of Instrumentation, 6(11):C11029, 2011.

[17] L. Rossi, P. Fischer, T. Rohe, and N. Wermes. Pixel Detectors : From Fundamentals to Applica- tions. Springer, 2006.

[18] H. Spieler. Semiconductor Detector Systems. Oxford University Press, 2005. [19] G. Lutz. Semiconductor Radiation Detectors. Springer, 2001.

[20] G. Knoll. Radiation Detection and Measurement. John Wiley & Sons, Inc., 2010.

[21] Antonio Cerdeira and Magali Estrada. Analytical Expressions for the Calculation of Pixel Detector Capacitances. IEEE Transactions on Nuclear Science, 44(1):63–65, February 1997.

[22] Emilio Gatti and Pavel Rehak. Semiconductor drift chamber - An application of a novel charge transport scheme. Nuclear Instruments and Methods in Physics Research, 225(3):608 – 614, 1984.

[23] M. Porro et al. Spectroscopic performances of DePMOS detector/amplifier device with respect to different filtering techniques and operating conditions. In Nuclear Science Symposium Conference Record, 2004 IEEE, volume 2, pages 724–728, Oct 2004.

[24] J. Kemmer and G. Lutz. New detector concepts. Nuclear Instruments and Methods in Physics Re- search Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 253(3):365 – 377, 1987.

[25] J. Kemmer et al. Experimental confirmation of a new semiconductor detector principle. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 288(1):92 – 98, 1990.

[26] E. Gatti, P.F. Manfredi, M. Sampietro, and V. Speziali. Suboptimal filtering of 1/f-noise in detector charge measurements. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 297(3):467 – 478, 1990. [27] Yannis Tsividis. Operation and Modeling of the MOS Transistor. McGraw-Hill, Inc., New York,

NY, USA, 1987.

[28] Behzad Razavi. Design of Analog CMOS Integrated Circuits. McGraw-Hill, Inc., New York, NY, USA, 2001.

[29] F.S. Goulding. Pulse-shaping in low-noise nuclear amplifiers: A physical approach to noise analysis. Nuclear Instruments and Methods, 100(3):493 – 504, 1972.

[30] V. Radeka. Optimum Signal-Processing for Pulse-Amplitude Spectrometry in the Presence of High-Rate Effects and Noise. IEEE Transactions on Nuclear Science, 15(3):455–470, June 1968. [31] E. Gatti and P. F. Manfredi. Processing the signals from solid-state detectors in elementary-particle

physics. La Rivista del Nuovo Cimento (1978-1999), 9(1):1–146, 1986.

[32] E. Gatti, M. Sampietro, and P.F. Manfredi. Optimum filters for detector charge measurements in presence of 1/f noise. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 287(3):513 – 520, 1990. [33] Matteo Porro et al. In Nuclear Science Symposium Conference Record, 2008. IEEE", title = "Large

format X-ray imager with mega-frame readout capability for XFEL, based on the DEPFET active pixel sensor, pages 1578–1586, Oct 2008.

[34] M. Porro et al. Expected performance of the DEPFET sensor with signal compression: A large format X-ray imager with mega-frame readout capability for the European XFEL. Nuclear Instru- ments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 624(2):509 – 519, 2010.

[35] M. Porro et al. Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL. IEEE Transactions on Nuclear Science, 59(6):3339–3351, Dec 2012.

[36] G. Lutz et al. DEPFET sensor with intrinsic signal compression developed for use at the XFEL free electron laser radiation source. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 624(2):528 – 532, 2010. [37] P. Lechner et al. DEPFET active pixel sensor with non-linear amplification. In Nuclear Science

Symposium Conference Record, 2011. IEEE, pages 563–568, Oct 2011.

[38] Stefan Aschauer et al. Internal charge injection for the calibration of DEPFETs with non-linear amplification. In Nuclear Science Symposium Conference Record, 2012. IEEE, pages 475–481, 2012.

[39] K. Hansen, C. Reckleben, P. Kalavakuru, J. Szymanski, and I. Diehl. 8-bit 5-MS/s Analog-to- Digital Converter for Pixel-Level Integration. IEEE Transactions on Nuclear Science, 60(5):3843– 3851, Oct 2013.

[40] David Moch et al. Calibration of the Non-Linear System Characteristic of a Prototype of the DSSC Detector for the European XFEL. In Nuclear Science Symposium Conference Record, 2014. IEEE, Nov 2014.

[41] K. Hansen, Helmut Klär, and Dirk Müntefering. Camera Head of the DSSC X-Ray Imager. In Nuclear Science Symposium Conference Record, 2011 IEEE, pages 668–672, Oct 2011.

[42] Manfred Kirchgessner. PhD thesis in progress at Heidelberg University.

[43] Matteo Porro et al. The Development of the DSSC Detector for the European XFEL: toward the First Ladder Camera. Nuclear Science Symposium Conference, N3-B3-3, 2015. IEEE, Nov 2015.

Record, 2012. IEEE, pages 591–596, Oct 2012.

[45] L. Bombelli, C. Fiorini, S. Facchinetti, M. Porro, and G. De Vita. A fast current readout strategy for the XFEL DePFET detector. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 624(2):360 – 366, 2010. [46] S. Facchinetti, L. Bombelli, C. Fiorini, M. Porro, G. De Vita, and F. Erdinger. Characterization

of the Flip Capacitor Filter for the XFEL-DSSC Project. IEEE Transactions on Nuclear Science, 58(4):2032–2038, Aug 2011.

[47] C. Fiorini et al. A Simple Technique for Signal Compression in High Dynamic Range, High Speed X-ray Pixel Detectors. IEEE Transactions on Nuclear Science, 61(5):2595–2600, Oct 2014. [48] K. Hansen, C. Reckleben, I. Diehl, M. Bach, and P. Kalavakuru. Pixel-level 8-bit 5-MS/s

Wilkinson-type digitizer for the DSSC X-ray imager: Concept study. Nuclear Instruments and Methods in Physics Research Section A, 629(1):269 – 276, 2011.

[49] C. Reckleben, K. Hansen, P. Kalavakuru, and I. Diehl. 8-bit 5-MS/s per-pixel ADC in an 8-by-8 Matrix. In Nuclear Science Symposium Conference Record, 2011 IEEE, pages 1713–1717, Oct 2011.

[50] Florian Erdinger. Design of High Density Memories for the DSSC Pixel Detector at XFEL. Diploma Thesis, Mannheim University, 2009.

[51] F. Erdinger and Peter Fischer. Compact Digital Memory Blocks for the DSSC Pixel Readout ASIC. In Nuclear Science Symposium Conference Record, 2010. IEEE, pages 1364–1367, Oct 2010.

[52] Jan M. Rabaey. Digital Integrated Circuits: A Design Perspective. Prentice-Hall, Inc., Upper Saddle River, NJ, USA, 1996.

[53] E. Quartieri and M. Manghisoni. High precision injection circuit for in-pixel calibration of a large sensor matrix. In 7th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), 2011, pages 73–76, July 2011.

[54] J. Bhasker and Rakesh Chadha. Static Timing Analysis for Nanometer Designs: A Practical Approach. Springer Publishing Company, Incorporated, 1st edition, 2009.

[55] Jan Soldat. PhD thesis in progress at Heidelberg University.

[56] Rene Brun and Fons Rademakers. ROOT - An object oriented data analysis framework. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 389(1):81 – 86, 1997.

[57] Christian Reckleben et al. A 64-by-64 Pixel-ADC Matrix. Nuclear Science Symposium Conference, N2AP-60, 2015. IEEE, Nov 2015.

Acknowledgements

First of all I want thank my wife Denise for sharing her life with mine and especially for being so considerate and supportive during submission times. In between the numerous chip submissions for the DSSC project, two babies were born who are all the world to us. I thank my children for being who they are, making me laugh and bringing joy to my life. I thank my parents for raising me to the person I am and helping me to develop a researching character.

I thank my supervisor, Prof. Dr. Peter Fischer, for giving me the opportunity to work on this exciting project and giving me the chance to be creative and let ideas develop. He has always been appreciative of my work and it is a pleasure to work in his group. I want to further thank Prof. Dr. Ivan Peric, KIT, for his support and advices. I am especially grateful that I had the opportunity to present my work at a number of international conferences. All the people at the Chair for Circuit Design and Simulation I want to thank for the friendly and productive working environment.

Working in the DSSC collaboration has been a great pleasure both from the scientific and human perspective. The exchange and discussions especially with the collaborating groups from DESY, led by Dr. Karsten Hansen and from Politecnico di Milano, led by Prof. Dr. Carlo Fiorini have always been fruitful.

I also thank all proof readers and of course the referees for reporting on my thesis. I know I am scratching only the surface here on the people I need to thank, it is out of scope to thank everyone here explicitly. I sincerely hope that nobody feels forgotten.